SAM stands for Scanning Acoustic Microscopy. It is the process of using ultrasonic waves to inspect samples for defects, manufacturing quality, and counterfeit parts. By sending sound waves into products OKOS can look at the reflection of the sound waves to determine the material properties and produce images of the internal parts of samples. Unlike other inspection techniques such as X-Ray inspection SAM is a safer inspection method for the used and allows for micron level resolution of multiple layers of an application.
OKOS designed SAM systems to fill a gap articulated by customers. Our products are focused on rich software driven instrumentation solutions with an underlying modular electro-mechanical architecture. This allows us to offer SAM solutions to startups, growing test labs, electronics components distributors, semiconductor designers and production facilities. Being highly vertically integrated, we are able to offer flexible solutions to meet customer specific requirements.
Scanning Acoustic Microscopy (SAM) is a must have in any semiconductor metrology lab that analyzes new products, new materials, customer returns, package failures, etc. Automated SAM tools ensure defect free yields in production lines.
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PVA TePla OKOS
7036 Tech Cir, Manassas
Virginia 20109
UNITED STATES
Phone: 1 703.880.3039
Email: info(at)okos.com
Web: www.pvatepla-okos.com
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