MICROELECTRONICS

Scanning Acoustic Microscopy for your semiconductor failure analysis and reliability needs; discrete packages, IGBTs, bonded wafers, PEMS.

Valuable tool for R&D, process development, customer returns and high volume quality inspection.

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VUE 250-P

VUE 400-P

MACROVUE-P NexGen

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PVA TePla OKOS
7036 Tech Cir, Manassas
Virginia 20109
UNITED STATES

Phone: 1 703.880.3039

Email: info(at)okos.com
Web: www.pvatepla-okos.com

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